• DocumentCode
    3526750
  • Title

    Influence of the magnetoelastic mechanism on the switching field fluctuations on Fe based amorphous microwires

  • Author

    Garcia, K.L. ; Varga, R. ; Vázquez, M.

  • Author_Institution
    Mater. Sci. Inst. of Madrid, CSIC, Madrid, Spain
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    49
  • Lastpage
    50
  • Abstract
    In the present work the shape and the origin of the switching field distribution are studied taking to account intrinsic information about the thermodynamics of the closure domain wall potential and the temperature dependence of the magnetoelastic contribution. The magnetoelastic mechanism is systematically followed with measurements of the switching field fluctuations for a Fe75-xCoxSi16B10 glass covered microwires family, with x from 0 to 60 and saturation magnetostriction values in the range of 2×10-6 to 28×10-6. Square shape hysteresis loops have been obtained using a VMS magnetometer at room temperature for all the studied samples. The temperature dependence of hysteresis loops and saturation magnetization values have been measured using a SQUID magnetometer in the temperature range from 5-300 K.
  • Keywords
    SQUID magnetometers; amorphous magnetic materials; boron alloys; cobalt alloys; iron alloys; magnetic domain walls; magnetic hysteresis; magnetic switching; magnetoelastic effects; magnetostriction; silicon alloys; 5 to 300 K; Fe75-xCoxSi16B10; SQUID magnetometer; VMS magnetometer; closure domain wall potential; glass covered microwires; hysteresis loops; magnetoelastic mechanism; saturation magnetization; saturation magnetostriction; switching field distribution; switching field fluctuations; Amorphous magnetic materials; Amorphous materials; Fluctuations; Iron; Magnetic domain walls; Magnetic domains; Magnetic switching; Magnetostriction; Saturation magnetization; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1463453
  • Filename
    1463453