Title :
Comparison of Breakdown Performances of Extruded Cables via the Enlargement Law
Author :
Marzinotto, M. ; Mazzanti, G. ; Mazzetti, C.
Author_Institution :
Dept. of Electr. Eng., Roma "La Sapienza" Univ.
Abstract :
In this paper, previous theoretical developments by one of the authors -relevant to the "enlargement law" - are applied for a benchmark between two alternative compounds candidate for the realization of the solid-extruded insulation of power cables. By resorting to the results of dielectric strength tests relevant to cable models, breakdown performances of full-size cables are investigated as a function of cable length. In particular, the focus is on the existence of the so-called crossing length, such that one of the two compounds performs better for cables longer than crossing length, and conversely the other for cables shorter than this. As a practical case-study, the breakdown performances of two cross-Linked Polyethylene (XLPE) compounds are compared on the basis of lightning impulse strength tests relevant to cable models, by analyzing various power cable voltage ratings, i.e. 6 kV, 20 kV, 150 kV and 400 kV. The application shows that, though the crossing length in fact exists, it is a strong function of cable size and voltage rating. As a general consequence, the choice of the best compound should be based on a comparison between the value of crossing length and typical installation lengths of real cables
Keywords :
XLPE insulation; electric breakdown; electric strength; power cable insulation; 150 kV; 20 kV; 400 kV; 6 kV; cross-linked polyethylene compounds; dielectric strength; electric breakdown; enlargement law; extruded cables; lightning impulse strength tests; power cable voltage ratings; solid-extruded insulation; Benchmark testing; Breakdown voltage; Cable insulation; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Lightning; Performance evaluation; Polyethylene; Power cables;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2006 IEEE Conference on
Conference_Location :
Kansas City, MO
Print_ISBN :
1-4244-0547-5
Electronic_ISBN :
1-4244-0547-5
DOI :
10.1109/CEIDP.2006.312043