DocumentCode :
3526980
Title :
Magnetization relaxation in sputtered thin Fe films: evidence of spin-pumping effect
Author :
Kuanr, Bijoy K. ; Kuanr, A.V. ; Camley, R.E. ; Celinzki, Z.
Author_Institution :
Dept. of Phys., Colorado Univ., Colorado Springs, CO, USA
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
73
Lastpage :
74
Abstract :
Polycrystalline Fe films were grown by magnetron sputtering on GaAs(100) substrates with a background pressure ∼10-7 Torr. The ferromagnetic resonance linewidth (FMR) of these thin Fe films in NM/Fe/NM structure (NM=Cu, Ti) was investigated to clarify the effect of spin transport on Gilbert damping. In Ti/Fe/Ti structure, Ti film is found to act as a good spin sink. This explains the large magnetization damping observed in the Ti/Fe/Ti structure.
Keywords :
copper; ferromagnetic materials; ferromagnetic relaxation; ferromagnetic resonance; iron; magnetic multilayers; magnetic thin films; magnetisation; metallic thin films; spin polarised transport; sputter deposition; titanium; 1E-7 torr; Cu-Fe-Cu; GaAs; Gilbert damping; Ti-Fe-Ti; ferromagnetic resonance linewidth; magnetization damping; magnetization relaxation; magnetron sputtering; polycrystalline films; spin sink; spin transport; spin-pumping effect; sputtered thin films; Damping; Educational institutions; Gallium arsenide; Iron; Magnetic films; Magnetic resonance; Magnetization; Scattering; Substrates; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463465
Filename :
1463465
Link To Document :
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