• DocumentCode
    3527176
  • Title

    Graphene field effect transistors for detection of ionizing radiation

  • Author

    Patil, Amol ; Lopez, Gabriel ; Foxe, Michael ; Childres, Isaac ; Roecker, Caleb ; Boguski, John ; Jovanovic, Igor ; Chen, Yong P.

  • Author_Institution
    Dept. of Phys., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    674
  • Lastpage
    676
  • Abstract
    A novel radiation detector based on a graphene field effect transistor (GFET) is experimentally demonstrated. The detection in GFET relies on the high sensitivity of the resistivity of graphene to the local change of electric field that can result from ionized charges produced in the underlying semiconductor substrate. We present the experimental results of our study on the graphene-based radiation detector response to X-rays. We observed increasing resistance change of graphene with increasing X-ray flux in an electrically biased GFET based on a Si substrate. We have measured the temporal characteristics of our detector, along with the sensitivity of the device at high (40 kV-80 μA) and low (15 kV-15 μA) X-ray fluxes. Furthermore, we demonstrate room-temperature operation of a graphene radiation sensor based on a SiC absorber.
  • Keywords
    X-ray detection; electrical resistivity; field effect transistors; fullerene devices; graphene; nuclear electronics; silicon radiation detectors; C; SiC absorber; X-ray flux; current 15 muA; current 80 muA; detector temporal characteristics; graphene field effect transistor; graphene radiation sensor; graphene-based radiation detector; ionizing charge production; ionizing radiation detection; resistivity analysis; voltage 15 kV; voltage 40 kV; Detectors; Electrical resistance measurement; Resistance; Silicon; Silicon carbide; Temperature measurement; X-rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873845
  • Filename
    5873845