DocumentCode :
3527235
Title :
Characterisation of reflected pulses as a sensitive measurement technique in EMC applications
Author :
Rajroop, P.J. ; House, H.
Author_Institution :
Dept. of Electr. Electron. & Inf. Eng., City Univ., London, UK
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
311
Abstract :
This paper reports a novel attempt at investigating the effects of the transient electromagnetic (EM) fields produced by the pulse propagation pattern, and its interactions with single element antenna probe, as pulses travel through an open conductor-plane transmission system. The experimental set-up, although designed for other specific investigations, lends itself to the study of electromagnetic coupling through shielding and apertures. The measurement technique is significant in EMC environments where it can be otherwise difficult to detect emission by traditional methods. Further work on line impedance matching and the study of these pulses that induced signals in the loop probes, led to the important detection of a curvature on the transmission medium. This technique can be useful in predicting flaws in shielding seams and enclosures
Keywords :
electromagnetic compatibility; EMC applications; EMC environments; apertures; electromagnetic coupling; emission detection; flaws prediction; line impedance matching; open conductor-plane transmission system; pulse propagation pattern; reflected pulses characterisation; sensitive measurement technique; shielding; shielding enclosures; shielding seams; single element antenna probe; transient electromagnetic fields; transmission medium curvature detection;
fLanguage :
English
Publisher :
iet
Conference_Titel :
High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
Conference_Location :
London
ISSN :
0537-9989
Print_ISBN :
0-85296-719-5
Type :
conf
DOI :
10.1049/cp:19990569
Filename :
820649
Link To Document :
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