DocumentCode
3527236
Title
Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and atomically-resolved image of an al cluster
Author
Saito, Yahachi ; Matsukawa, Tomohiro ; Asaka, Koji ; Nakahara, Hitoshi
Author_Institution
Dept. of Quantum Eng., Nagoya Univ., Nagoya, Japan
fYear
2009
fDate
20-24 July 2009
Firstpage
7
Lastpage
8
Abstract
In this work, aluminum (Al) was deposited on MWNT field emitters and its effects on FE properties were studied by FEM. A considerable improvement of emission stability was obtained by Al-deposition, and an atomically-resolved image of an Al cluster with face-centered structure was observed by FEM.
Keywords
aluminium; carbon nanotubes; field emitter arrays; finite element analysis; metal clusters; Al; Al cluster; Al-deposited carbon nanotubes; C; FEM; MWNT field emitters; atomically-resolved image; emission stability; face-centered structure; field emission microscopy; Atomic layer deposition; Atomic measurements; Carbon nanotubes; Electron emission; Electron microscopy; Fluctuations; Iron; Spatial resolution; Stability; Surface cleaning;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location
Shizuoka
Print_ISBN
978-1-4244-3587-6
Electronic_ISBN
978-1-4244-3588-3
Type
conf
DOI
10.1109/IVNC.2009.5271633
Filename
5271633
Link To Document