Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement

Author

Ekawita, Riska ; Rahmawati, E. ; Mikrajuddin Abdullah, K.

Author_Institution

Phys. Dept., Universitas Bengkulu, Bengkulu, Indonesia

fYear

2009

fDate

23-25 Nov. 2009

Firstpage

1

Lastpage

3

Abstract

A four point probe-based resistivity meter using LOG112 and C8051F006 SoCs has been developed. The resistivity meter was calibrated and examined. Current-voltage characteristic-based resistances of resistors are consistent with those labeled to the resistors. Resistivities of the resistors are independent of the injected current, which agree with theory. The resistivity of TiO₂ thin film depends on the injected current due to minority and/or majority carrier injection.

Keywords

electric resistance measurement; electrical resistivity; resistors; semiconductor materials; semiconductor thin films; system-on-chip; titanium compounds; C8051F006 SoC; LOG112 SoC; TiO₂; current-voltage characteristic; four point probe-based resistivity meter; majority carrier injection; minority carrier injection; resistances; resistivities; resistors; thin film; Calibration; Conductivity measurement; Current measurement; Electrodes; Microcontrollers; Probes; Resistors; System-on-a-chip; Voltage; Voltmeters; C8051F006; Four point probe; I-V curve; LOG112; SoC;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation, Communications, Information Technology, and Biomedical Engineering (ICICI-BME), 2009 International Conference on

Conference_Location

Bandung

Print_ISBN

978-1-4244-4999-6

Electronic_ISBN

978-1-4244-5000-8

Type

conf

DOI

10.1109/ICICI-BME.2009.5417218

Filename

5417218