Title :
Low-cost sensors for image based measurement of 2D velocity and yaw rate
Author :
Joos, Malte ; Ziegler, Julius ; Stiller, Christoph
Author_Institution :
Dept. of Meas. & Control (MRT), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
Abstract :
Numerous applications require precise determination of the motion of a textured surface. Image based sensors are attractive for this purpose, since they are contactless and do not suffer from slip effects. Moreover, they do not only measure scalar speed, but can determine velocity as a 2D vectorial quantity, and, if two sensors are combined, can even observe yaw rate of the surface. If this kind of sensor is mounted inversely on a vehicle, it can determine its motion by measuring the relative displacement of the road surface. In this paper we will use a commercial motion sensor that has been originally designed for application in an optical computer mouse. We will show that, by well-considered dimensioning of the optical part of the system, this sensor can measure velocities in a range that is typical for automotive application. The result is a highly integrated, low-cost, angle sensitive motion sensor that does not exhibit slip effects. We evaluate this sensor through testing on a vehicle that is equipped with reference sensors, with special consideration on the advantages of this measurement principle over conventional wheel speed sensors.
Keywords :
angular velocity measurement; displacement measurement; image sensors; image texture; 2D velocity measurement; 2d vectorial quantity; Yaw rate; angle sensitive motion sensor; automotive application; image based measurement; image based sensors; low-cost sensors; optical computer mouse; relative displacement measurement; road surface; slip effects; textured surface; wheel speed sensors; Application software; Displacement measurement; Image sensors; Motion measurement; Optical computing; Optical design; Optical sensors; Road vehicles; Surface texture; Velocity measurement;
Conference_Titel :
Intelligent Vehicles Symposium (IV), 2010 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-7866-8
DOI :
10.1109/IVS.2010.5547979