DocumentCode
3527708
Title
Use of Triple Modular Redundancy (TMR) technology in FPGAs for the reduction of faults due to radiation in the readout of the ATLAS monitored drift tube (MDT) chambers
Author
Fras, M. ; Kroha, H. ; Loeben, J.V. ; Reimann, O. ; Richter, R. ; Weber, B.
Author_Institution
Max-Planck-Inst. fur Phys., München, Germany
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
834
Lastpage
837
Abstract
The Triple Modular Redundancy (TMR) technology allows protection of the functionality of FPGAs against single event upsets (SEUs). Each logic block is implemented three times with a 2-out-of-3 voter at the output. Thus, the correct logical value is available even if there is an upset bit in one location. We applied TMR to the configuration code of a Virtex-II-2000 FPGA, which serves as the on-chamber readout processor of the ATLAS monitored drift tubes (MDTs). We describe the code implementation, results of performance measurements and discuss several limitations of the method. Finally, we present a supplementary technology called “scrubbing”. It permanently checks the configuration memory while the FPGA is operating, and corrects upset configuration bits when necessary.
Keywords
drift chambers; field programmable gate arrays; nuclear electronics; readout electronics; ATLAS monitored drift tube chambers; Virtex-II-2000 FPGA; configuration code; configuration memory; logic block; onchamber readout processor; scrubbing technology; single event upsets; triple modular redundancy technology; upset configuration bits; Clocks; Electron tubes; Field programmable gate arrays; Microprogramming; Radiation effects; Single event upset; Tunneling magnetoresistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5873878
Filename
5873878
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