Control of the size of octahedral FePt nano-dots and their magnetic properties

Author

Ito, H. ; Shima, T. ; Takanashi, Koki ; Takahashi, Y.K. ; Hono, K.

Author_Institution

Inst. for Mater. Res., Tohoku Univ., Sendai, Japan

fYear

2005

fDate

4-8 April 2005

Firstpage

167

Lastpage

168

Abstract

In this paper, the control of the size of octahedral FePt nano-dots has been performed by changing the layer thickness and their magnetic properties have also been investigated. FePt layers were alternately deposited by sputtering on MgO [001] single crystal substrates prepared by electron beam evaporation. Structural characterization was done by RHEED, XRD and TEM. Magnetization and coercivity data were gathered using a vibrating sample magnetometer equipped with a superconducting magnet.

Keywords

X-ray diffraction; coercive force; electron beam deposition; ferromagnetic materials; iron alloys; magnetic multilayers; magnetometers; metallic superlattices; nanostructured materials; platinum alloys; reflection high energy electron diffraction; size control; sputter deposition; transmission electron microscopy; FePt-MgO; MgO [001] single crystal substrates; RHEED; TEM; XRD; coercivity; electron beam evaporation; layer thickness; magnetization; octahedral FePt nano-dots; size control; sputtering; Coercive force; Electron beams; Magnetic properties; Magnetization; Magnetometers; Size control; Sputtering; Superconducting magnets; Thickness control; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1463512

Filename

1463512