• DocumentCode
    3527795
  • Title

    Nanometer-scale distribution of field emission current from the arc-prepared carbon thin film

  • Author

    Nagashima, S. ; Fujita, S. ; Yamada, Y. ; Sasaki, M.

  • Author_Institution
    Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba, Japan
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    11
  • Lastpage
    12
  • Abstract
    In this work, we used an ultrahigh vacuum (UHV) STM system with a surface treatment chamber where we prepare the carbon film by means of arc-discharge deposition of a high purity graphite rod under the same condition as in the case of the carbon coating that enhances FE characteristics. According to the STM geometrical images, the surface consists of graphite grains whose crystallinities and orientations are different, and has no sharp protrusions such as carbon nanotubes, where we cannot expect such a high field enhancement factor as to explain the improvement of the FE characteristics.
  • Keywords
    arcs (electric); carbon nanotubes; field emission; graphite; scanning tunnelling microscopy; thin films; C; arc-discharge deposition; carbon nanotubes; carbon thin film; crystallinity; field emission current; graphite rod; nanometer scale distribution; surface treatment chamber; ultrahigh vacuum STM system; Carbon dioxide; Coatings; Dielectric materials; Feedback loop; Iron; Surface treatment; Switches; Transistors; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
  • Conference_Location
    Shizuoka
  • Print_ISBN
    978-1-4244-3587-6
  • Electronic_ISBN
    978-1-4244-3588-3
  • Type

    conf

  • DOI
    10.1109/IVNC.2009.5271664
  • Filename
    5271664