Microstructure and magnetic properties of interfacially disordered FePt particles

Author

Takahashi, Y.K. ; Hono, K. ; Okamoto, S. ; Kitakami, O. ; Shimada, Y.

Author_Institution

Nat. Inst. for Mater. Sci., Tsukuba, Japan

fYear

2005

fDate

4-8 April 2005

Firstpage

169

Lastpage

170

Abstract

In order to clarify the effect of the interfacially disordered layer on the magnetic properties, we have investigated the magnetic properties of L1₀ FePt particles with a thin disordered interface. 10 nm FePt films were deposited on MgO [001] single crystal substrates at 700°C using a multiple de-sputtering system. A 5 nm amorphous Al₂O₃ layer was subsequently deposited at room temperature. Magnetization were measured by a SQUID magnetometer with and without the Al₂O₃ layer. The microstructure and film morphology were characterized by TEM. A change of magnetization reversal mechanism due to the presence of the soft disordered layer was observed.

Keywords

SQUID magnetometers; crystal microstructure; ferromagnetic materials; iron alloys; magnetic thin films; magnetisation reversal; metallic thin films; platinum alloys; sputter deposition; 10 nm; 25 degC; 5 nm; 700 degC; FePt-Al₂O₃; SQUID magnetometer; TEM; interfacially disordered layer; magnetic properties of L1₀ FePt particles; microstructure; multiple de-sputtering system; Amorphous magnetic materials; Magnetic anisotropy; Magnetic films; Magnetic materials; Magnetic properties; Magnetization; Microstructure; Nanoparticles; Perpendicular magnetic anisotropy; Surface morphology;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1463513

Filename

1463513