Title :
Ozone Dynamics Ultraviolet Spectrometer (ODUS) on board GCOM-A1
Author :
Shibasaki, K. ; Suzuki, M. ; Yamamoto, Yusaku ; Kuze, Akihiko ; Kawashima, T. ; Ogawa, Tomomi
Author_Institution :
Earth Obs. Res. Center, Nat. Space Dev. Agency of Japan, Tokyo
Abstract :
The ODUS is a UV-Visible spectrometer designed to monitor the global total ozone field from a Japanese satellite named GCOM (Global Change Observation Mission) A1. This instrument measures backscattered solar UV from the Earth´s atmosphere and surface same as TOMS and GOME type instruments. It adopts Fastie-Ebert type optics (F/5.0, f=250 mm) with one dimension CMOS type silicon photo diode array detector. The optical configuration of ODUS is much like the TOMS but extending spectral coverage of 306 nm to 420 nm and using a newly developed, having high quantum yield, array detector with 230 bands. The spectral resolution is about 0.5 nm. Its instrumental field of view is 1.6 deg×1.6deg, 20 km×20 km at nadir view. The main objective of ODUS is to map the total ozone field with high accuracy in one day. Other objectives are to monitor the sulfur dioxide (SO2) of volcanic origin and of also polluted urban areas. Minor constituents relating to ozone chemistry such as nitrogen dioxide (NO2) under polluted conditions, BrO, and OClO are target molecules to be measurable
Keywords :
air pollution measurement; atmospheric composition; atmospheric measuring apparatus; ozone; remote sensing; stratosphere; 306 to 420 nm; BrO; Fastie-Ebert type optics; GCOM; GCOM-A1; NO2; O3; OClO; ODUS; Ozone Dynamics Ultraviolet Spectrometer; SO2; Si photodiode array detector; UV spectrometer; Visible spectrometer; air pollution; atmosphere; chemical composition; equipment; instrument; measurement technique; ozone; satellite remote sensing; stratosphere; Atmospheric measurements; Instruments; Monitoring; Optical arrays; Pollution measurement; Satellites; Sensor arrays; Silicon; Spectroscopy; Terrestrial atmosphere;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
DOI :
10.1109/IGARSS.2000.860424