DocumentCode
3528018
Title
Direct observation of ferromagnetic exchange by magnetic force microscopy
Author
Vanhaverbeke, A. ; Viret, M. ; Klein, O.
Author_Institution
Service de Physique de l´´Etat Condense, CEA Orme des Merisiers, Gif-sur-Yvette, France
fYear
2005
fDate
4-8 April 2005
Firstpage
189
Lastpage
190
Abstract
In this study, the exchange coupling at the interface of two different magnetic materials remains is investigated by using an original local technique combining lithography with scanning probe microscopy. A home-made magnetic force microscopy device that allows measurements in perpendicular magnetic field up to 1.8 T, operating in noncontact mode is used. The sample used is a bilayer of thin layer of nickel on a very thick yttrium-iron garnet layer (YIG), with strong perpendicular anisotropy and developing stripes of alternate magnetization. The nickel top-layer is prepared to obtain several 400 nm-wide Hall crosses by means of electronic lithography. From the measurements done, the YIG magnetic configuration is determined in which the dark regions correspond to the minority magnetic domains, whose magnetization is opposite to the external field and to the moment of the scanning tip. Hall effect measurements of nickel show that an extraordinary Hall effect depending on the perpendicular component of magnetization is predominant. A strong coupling between garnet and nickel is observed, leading to a measurable rotation of the magnetization planar component just by displacement of the YIG domains underneath.
Keywords
Hall effect; electron beam lithography; exchange interactions (electron); ferromagnetic materials; garnets; interface magnetism; magnetic domains; magnetic force microscopy; magnetic moments; nickel; perpendicular magnetic anisotropy; yttrium compounds; 400 nm; Ni-YFe5O12; Ni-YIG; bilayer; dark regions; electronic lithography; exchange coupling; extraordinary Hall effect; ferromagnetic exchange; magnetic configuration; magnetic force microscopy device; magnetic materials; magnetization planar component rotation; minority magnetic domains; moment; noncontact mode; perpendicular anisotropy; scanning tip; Couplings; Garnets; Hall effect; Lithography; Magnetic domains; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetization; Nickel;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN
0-7803-9009-1
Type
conf
DOI
10.1109/INTMAG.2005.1463523
Filename
1463523
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