Title :
Progress of field emission study in 50 years: Mass analysis of field emitters and bio molecules by the scanning atom probe
Author :
Nishikawa, Osamu ; Taniguchi, Masahiro
Author_Institution :
Kanazawa Inst. of Technol., Nonoichi, Japan
Abstract :
In order to fabricate reliable field emitters, the mass analysis of emitter surface at atomic level is the fundamental requirement. The only qualified instrument for the evaluation of the emitter surface is the atom probe (AP).
Keywords :
field emission; mass spectrometer accessories; biomolecules; emitter surface; field emission study; field emitters; mass analysis; reliable field emitter; scanning atom probe; Atomic measurements; Carbon dioxide; Electrodes; Electron emission; Electron microscopy; Fabrication; Instruments; Laboratories; Organic materials; Probes;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location :
Shizuoka
Print_ISBN :
978-1-4244-3587-6
Electronic_ISBN :
978-1-4244-3588-3
DOI :
10.1109/IVNC.2009.5271680
