DocumentCode
3528073
Title
Progress of field emission study in 50 years: Mass analysis of field emitters and bio molecules by the scanning atom probe
Author
Nishikawa, Osamu ; Taniguchi, Masahiro
Author_Institution
Kanazawa Inst. of Technol., Nonoichi, Japan
fYear
2009
fDate
20-24 July 2009
Firstpage
25
Lastpage
26
Abstract
In order to fabricate reliable field emitters, the mass analysis of emitter surface at atomic level is the fundamental requirement. The only qualified instrument for the evaluation of the emitter surface is the atom probe (AP).
Keywords
field emission; mass spectrometer accessories; biomolecules; emitter surface; field emission study; field emitters; mass analysis; reliable field emitter; scanning atom probe; Atomic measurements; Carbon dioxide; Electrodes; Electron emission; Electron microscopy; Fabrication; Instruments; Laboratories; Organic materials; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location
Shizuoka
Print_ISBN
978-1-4244-3587-6
Electronic_ISBN
978-1-4244-3588-3
Type
conf
DOI
10.1109/IVNC.2009.5271680
Filename
5271680
Link To Document