DocumentCode :
3528095
Title :
The performance of GridPix detectors
Author :
Bilevych, Y. ; Carballo, V. M Blanco ; Fransen, M. ; van der Graaf, H. ; de Groot, N. ; Hartjes, F. ; Hessey, N. ; Konig, A. ; Koppert, W.J.C. ; Rogers, M. ; Schmitz, J. ; Schön, R. ; Timmermans, J. ; Visschers, J.
Author_Institution :
Nikhef, Amsterdam, Netherlands
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
944
Lastpage :
948
Abstract :
A GridPix detector is a gaseous detector capable of detecting individual single primary electrons from ionizing particles. Such a detector consists of a pixel chip as active anode covered with a thin layer of silicon rich silicon nitride (SiRN) for protection against discharges, an integrated amplification grid (InGrid), applied on top of the chip by wafer post processing techniques, and a cathode plane. The drift region is between the grid and cathode while the gas gain occurs between the chip and the grid. The discharge quenching properties of the SiRN layer have been determined as well as the relation on grid capacitance, grid voltage and gas mixture. Part of the detectors in this report were of the type Gossip, a GridPix detector with a drift gap of ~1 mm. Using such thin drift layer, one may consider this detector as a replacement for a silicon pixel detector. The performance of three Gossip detectors has been investigated by measurements in a test beam at CERN.
Keywords :
electron detection; silicon radiation detectors; CERN; Gossip detector; GridPix detector; discharge quenching properties; drift region; electron detection; gas mixture; gaseous detector; grid voltage; integrated amplification grid; pixel chip system; silicon pixel detector; silicon rich silicon nitride; test beam measurement; wafer post processing technique; Capacitance; Charge measurement; Detectors; Discharges; Pixel; Semiconductor device measurement; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5873901
Filename :
5873901
Link To Document :
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