Scanning hall probe microscopy (SHPM) using quartz crystal AFM feedback

In the scanning Hall probe microscopy (SHPM) technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is usually used for bringing the Hall sensor into close proximity of a sample. Here, we used quartz crystal AFM feedback in microfabrication of Hall sensors and in the operation of SHPM. This method eliminates the necessity of conducting samples in SHPM.