• DocumentCode
    3528141
  • Title

    Vertical thin film field emitter array for high resolution CdTe X-ray imaging device

  • Author

    Tsunekaw, Yuki ; Nakagaw, Masashi ; Neo, Yoichiro ; Morii, Hisashi ; Aoki, Toru ; Mimura, Hidenori ; Nagao, Masayoshi ; Yoshida, Tomoya ; Kanemaru, S.

  • Author_Institution
    Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    319
  • Lastpage
    320
  • Abstract
    A photon-counting mode X-ray imaging device has a lot of interests, such as high-sensitivity and energy-discrimination. We have studied about photon-counting mode X-ray image sensor which was constructed with CdTe, and already developed for the line sensor. The imaging device that could detect X-rays by using Field Emitter Array (FEA) was proposed. The resolution of the image is decided by the spot size of the electron beam. In this report, Vertical Thin Film Field Emitter Array (VTF-FEA) was fabricated by using an Ion Induced Bending (PiB) process. And we have constructed an imaging device with VTF-FEA and the CdTe detector. And the principle inspection was performed.
  • Keywords
    X-ray imaging; bending; cadmium compounds; field emitter arrays; image resolution; image sensors; thin film devices; CdTe; electron beam spot size; high resolution X-ray imaging device; image resolution; image sensor; ion induced bending process; photon-counting mode; vertical thin film field emitter array; Energy resolution; Field emitter arrays; High-resolution imaging; Image resolution; Image sensors; Optical imaging; Optoelectronic and photonic sensors; Thin film devices; X-ray detection; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
  • Conference_Location
    Shizuoka
  • Print_ISBN
    978-1-4244-3587-6
  • Electronic_ISBN
    978-1-4244-3588-3
  • Type

    conf

  • DOI
    10.1109/IVNC.2009.5271685
  • Filename
    5271685