• DocumentCode
    352823
  • Title

    Satellite Image Processing for Haze and Aerosol mapping (SIPHA): code description and presentation of results

  • Author

    Sifakis, N.I. ; Soulakellis, N.A.

  • Author_Institution
    Inst. for Space Appl. & Remote Sensing, Nat. Obs. of Athens, Greece
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    222
  • Abstract
    The monitoring of aerosol concentrations becomes a high environmental priority particularly in urban areas. The aerosol optical thickness in the visible spectrum is a surrogate for fine aerosol concentrations, especially under pollution conditions with low mixing height, and can be measured with high ground sampling density with the help of satellite sensors. The SIPHA code was developed for such application on high-resolution satellite images and allows quantification of the aerosol optical thickness over land, snow and sea. The code compares multitemporal satellite data sets and evaluates radiometric alterations due to the optical atmospheric effects of aerosols. A novel feature of this code is the decoupling of the radiometric alterations due to optical atmospheric effects from those due to ground temporal variations. A real-scale application of the code on time series of Landsat data was carried out over European urban sites
  • Keywords
    aerosols; air pollution measurement; atmospheric composition; atmospheric techniques; geophysical signal processing; remote sensing; SIPHA; Satellite Image Processing for Haze and Aerosol mapping; aerosol; air pollution; atmosphere; data processing; haze; light scattering; measurement technique; optical method; optical thickness; optics; satellite remote sensing; urban area; visible; Aerosols; Density measurement; Image processing; Optical mixing; Optical sensors; Pollution; Radiometry; Satellite broadcasting; Sea measurements; Urban areas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.860473
  • Filename
    860473