• DocumentCode
    3528411
  • Title

    An efficient simultaneous switching noise analysis of high density multi-layer packages and PCBs considering the power and ground planes

  • Author

    Choi, Joon-Ho ; Hong, Young-Seok ; KO, Chang-Woo ; Kim, Yeong-Gil ; Kim, Taek-Soo ; Kong, Jeong-Taek

  • Author_Institution
    Semicond. R&D Center, Samsung Electron. Co. Ltd., Kyungki, South Korea
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    In today´s advanced semiconductor products, the width of the bus and the operating frequency increase. As a result, more simultaneous switching noise (SSN) is observed. However, SSN analysis requires the modeling of power and ground planes. The PEEC (Partial Element Equivalent Circuit) method is often used for modeling the planes but it suffers from a large amount of computation time and the limited size of PCB it can handle. This paper proposes a new fast method of generating an equivalent circuit networks for multi-layer packages and PCBs. A library of parasitics is built for different vertical structures and materials by using a electromagnetic field solver. This library is used to generate the equivalent circuit without the need for the complex field solving procedure. Compared to the conventional method (PEEC), the proposed method drastically reduces the time and effort for generating the equivalent circuit model with the same accuracy. This method has been used to design a variety of high speed memory module products
  • Keywords
    circuit analysis computing; circuit noise; equivalent circuits; packaging; printed circuits; switching; EM field solver; equivalent circuit model; ground plane modelling; high density PCBs; high density packages; high speed memory module products; multi-layer PCB; multi-layer packages; parasitics library; power plane modelling; simultaneous switching noise analysis; vertical structures; Circuit simulation; Computer aided engineering; Electronics packaging; Equivalent circuits; Libraries; Power generation; Power semiconductor switches; Research and development; Semiconductor device noise; Semiconductor device packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI and CAD, 1999. ICVC '99. 6th International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7803-5727-2
  • Type

    conf

  • DOI
    10.1109/ICVC.1999.820825
  • Filename
    820825