DocumentCode :
3528854
Title :
Co valence and possible spin transformation in diluted magnetic semiconductors Zn1-zMgzCo0.15O and Zn1-xCoxO
Author :
Peleckis, G. ; Wang, X.L. ; Liu, R.S. ; Dou, S.X.
Author_Institution :
ISEM, Wollongong Univ., Australia
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
283
Lastpage :
284
Abstract :
In this paper, possible spin transformation and Co valence in dilute magnetic semiconductors is studied. Polycrystalline samples of Zn1-xCoxO (0.05≤x≤0.17) and Zn1-zMgzCo0.15O are prepared by rapid oxalate decomposition technique. X-ray diffraction is used to determine phase purity of the samples. Co valence state 2+ is determined by X-ray absorption near edge spectroscopy (XANES) using synchrotron irradiation. Magnetic properties measured show that all samples are paramagnetic and magnetization hysteresis measurement indicated that there is no trace of ferromagnetism. From Curie-Weiss fittings at high temperature region, the effective magnetic moment (μeff) is 3.87μB/Co which corresponds to that of tetrahedral Co2+ high spin state. When fitting at T approaches 0 K, μeff = 2.82μB/Co is observed indicating a possible spin state transition to Co2+ low spin state.
Keywords :
X-ray diffraction; XANES; cobalt compounds; magnesium compounds; magnetic hysteresis; magnetic moments; paramagnetic materials; semimagnetic semiconductors; valence bands; zinc compounds; Curie-Weiss fittings; X-ray absorption near edge spectroscopy; X-ray diffraction; Zn1-xCoxO; Zn1-zMgzCo0.15O; dilute magnetic semiconductors; effective magnetic moment; magnetization hysteresis; phase purity; polycrystalline samples; rapid oxalate decomposition technique; spin state transition; synchrotron irradiation; valence state; Electromagnetic wave absorption; Magnetic hysteresis; Magnetic properties; Magnetic semiconductors; Magnetization; Paramagnetic materials; Spectroscopy; Synchrotrons; X-ray diffraction; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463570
Filename :
1463570
Link To Document :
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