DocumentCode
3529126
Title
Combining image derived spectra and physics based models for hyperspectral image exploitation
Author
Schott, John R.
Author_Institution
Center for Imaging Sci., Rochester Inst. of Technol., NY, USA
fYear
2000
fDate
2000
Firstpage
15
Lastpage
24
Abstract
This paper addresses a conceptual approach to hyperspectral image assessment that uses physics-based models to constrain multiparameter inversion algorithms aimed at quantitative measurement of material properties. Sensing approaches include use of a single hyperspectral image with many spectral samples, a sequence of images acquired over time, and widely different types of measurements from a range of sensor types. We propose a conceptual approach for merging these data into a common framework to allow simultaneous exploitation of these multiparameter data sets. Physics-based models predict or constrain the range of observable parameters associated with a target or material condition, then model matching or optimization methods invert a measurement set to a target type or condition. 2 examples are presented using hyperspectral data sets. The first involves characterizing atmospheric constituents using the MODTRAN Code to constrain the solutions. The second uses a radiation propagation model to drive an inversion of hyperspectral data to multiple water quality parameters. Finally, we discuss how more involved 3D physics-based synthetic image models may hold a key to image exploitation algorithms
Keywords
geophysics computing; image processing; merging; remote sensing; sensor fusion; spectral analysis; MODTRAN; atmospheric constituents; data merging; hyperspectral image; hyperspectral image assessment; hyperspectral image exploitation; image derived spectra; measurement set inversion; model matching; multiparameter data sets; multiparameter inversion algorithms; optimization; physics based models; quantitative measurement; radiation propagation model; spectral samples; synthetic image models; Atmospheric modeling; Hyperspectral imaging; Hyperspectral sensors; Image sensors; Material properties; Merging; Optimization methods; Physics; Predictive models; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Imagery Pattern Recognition Workshop, 2000. Proceedings. 29th
Conference_Location
Washington, DC
Print_ISBN
0-7695-0978-9
Type
conf
DOI
10.1109/AIPRW.2000.953598
Filename
953598
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