• DocumentCode
    3529331
  • Title

    Low noise preamplifier ASIC for the PANDA EMC

  • Author

    Wieczorek, P. ; Flemmin, H.

  • Author_Institution
    GSI Darmstadt, Darmstadt, Germany
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    1319
  • Lastpage
    1322
  • Abstract
    For the electromagnetic calorimeter of the PANDA detector a preamplifier ASIC named APFEL (ASIC for Panda Front-end Electronics) has been developed at GSI. It is optimized for the readout of large area avalanche photodiodes (LAAPD) with a capacitance of 300 pF and an event rate of 350 kHz. The ASIC has two equivalent analog channels each consisting of a charge sensitive amplifier, a shaper stage and differential output drivers. For operating the ASIC in a wide temperature range programmable voltage references are implemented on chip. The characterization of the third ASIC iteration at a temperature of T = -20° C and a detector capacitance of 300 pF results in an equivalent noise charge of ENC = (0.62 ± 0.03) fC and a maximum input charge of 6.3 pC. Therefore a dynamic range of over 10 000 follows. The peaking time of the shaped signal was measured to tp = (248 ± 3)ns. The event rate independent power consumption of one channel is P = (56.5 ± 0.5)mW.
  • Keywords
    application specific integrated circuits; avalanche photodiodes; nuclear electronics; particle calorimetry; preamplifiers; APFEL; ASIC for Panda Front-End Electronics; GSI; LAAPD readout; PANDA EMC; PANDA detector electromagnetic calorimeter; analog channels; capacitance 300 pF; charge sensitive amplifier; differential output drivers; equivalent noise charge; frequency 350 kHz; large area avalanche photodiodes; low noise preamplifier ASIC; on chip programmable voltage references; shaper stage; temperature 253.15 K; Application specific integrated circuits; Capacitance; Detectors; Dynamic range; Electromagnetic compatibility; Noise; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5873982
  • Filename
    5873982