Title :
Low-noise current preamplifier for photodiodes with DC-current rejector and precise intensity meter suited for optical light spectroscopy
Author :
Pullia, A. ; Zocca, F.
Author_Institution :
Ist. Naz. di Fis. Nucleare, Univ. of Milan, Milan, Italy
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
A low-noise large dynamic-range current preamplifier for photodiode current signals is presented. The circuit is equipped with a smart device for automatic removal of the DC current of the photodiode. This device sinks away the exact amount of DC current from the preamplifier input, yielding auto zeroing of the output-voltage offset, while introducing the minimum electronic noise possible. As a result the measurement dynamic-range is maximized. An auxiliary inspection point is provided which precisely tracks the DC component of the photodiode current. This auxiliary signal may be used for precise beam alignment and diagnostic purposes. The excellent gain stability and linearity make the circuit perfectly suited for optical-light pulse spectroscopy. Applications include two-dimensional characterization of semiconductor detectors, ultra-precise characterization of laser beam stability, particle sizing in the 100 nm range, confocal microscopy.
Keywords :
current limiters; intensity measurement; optical variables measurement; photodiodes; preamplifiers; 2D semiconductor detector characterization; DC current rejector; automatic photodiode DC current removal; auxiliary inspection point; confocal microscopy; diagnostic purposes; large dynamic range current preamplifier; low noise current preamplifier; optical light pulse spectroscopy; optical light spectroscopy; output voltage offset autozeroing; particle sizing; photodiode current signals; precise beam alignment; precise intensity meter; smart device; ultraprecise laser beam stability characterization; Capacitance; Laser beams; Measurement by laser beam; Noise; Photodiodes; Preamplifiers; Radio frequency;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873988