Title :
Compact digital memory blocks for the DSSC pixel readout ASIC
Author :
Erdinger, Florian ; Fischer, Peter
Author_Institution :
Inst. of Comput. Eng., Heidelberg Univ., Heidelberg, Germany
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
The European XFEL will have a burst rate of up to 5 MHz arranged in bunch trains each comprising up to 3000 pulses. The inter bunch train rate will be 10 Hz. The pixel readout of the DSSC (DEPFET Sensor with Signal Compression) foreseen for this machine will immediately digitize all analogue charges. The digital data is then stored locally within the pixels before it is read out. In order to accumulate a maximum number of events during the XFEL bunch trains, a compact digital memory solution is required. Relatively slow concepts can be implemented because access times of >; 200 ns are required. Readout of the pixel memories will be done in between of the XFEL bunch trains. We have therefore designed and tested two compact storage solutions based on static or dynamic storage in the IBM 130 nm technology, both of them using only three metalization layers within the pixels. The DSSC readout chip will comprise 4096 pixels, each pixel having a size of 229 mm × 204 μm. One third of the pixel has been allocated for the digital storage.
Keywords :
application specific integrated circuits; high energy physics instrumentation computing; readout electronics; DEPFET sensor-with-signal compression; DSSC pixel readout ASIC; DSSC readout chip; European XFEL; IBM technology; XFEL bunch trains; compact digital memory solution; compact storage solution; digital storage; dynamic storage; picture size 4096 pixel; pixel memories; pixel readout; size 204 mum; size 229 mm; size 30 nm; static storage; Decision support systems; Layout; Logic gates; Pixel; Power demand; Random access memory; Transistors;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5873993