• DocumentCode
    3529717
  • Title

    Large area, high spatial resolution tracker for new generation of high luminosity experiments in Hall A at Jefferson Lab

  • Author

    Bellini, V. ; Capogni, M. ; Castelluccio, D. ; Colilli, S. ; Cisbani, E. ; De Leo, R. ; Fratoni, R. ; Frullani, S. ; Garibaldi, F. ; Giuliani, F. ; Giusa, A. ; Gricia, M. ; Lucentini, M. ; Meddi, F. ; Minutoli, S. ; Musico, P. ; Noto, F. ; De Oliveira, R.

  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    1423
  • Lastpage
    1426
  • Abstract
    In 2014 the CEBAF electron accelerator at Jefferson Lab (JLab) will deliver a longitudinally polarized (up to 85%), high intensity (up to 100 μA) beam with maximum energy of 12 GeV, twice the present value. To exploit the new opportunities that the energy upgrade will offer, a new spectrometer (Super BigBite - SBS) is under development, featuring very forward angle, large acceptance and ability to operate in high luminosity environment. The tracking system of SBS will consist of large area (40×150 cm2 and 50×200 cm2), high spatial resolution (better than 100 μm) chambers based on the GEM technology and 2 small (10×20 cm) Silicon Strip Detector planes. The design of the GEM chambers and its sub-components such as the readout electronics is resented here.
  • Keywords
    electron accelerators; nuclear electronics; particle beam diagnostics; readout electronics; silicon radiation detectors; spectrometers; tracking; CEBAF electron accelerator; GEM chambers; GEM technology; Hall A; Jefferson Lab; SBS spectrometer; energy upgrade; high luminosity experiments; high spatial resolution chambers; large area high spatial resolution tracker; longitudinally polarized high intensity beam; readout electronics; silicon strip detector planes; tracking system; Detectors; Field programmable gate arrays; Scattering; Silicon; Spatial resolution; Strips; Target tracking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874007
  • Filename
    5874007