Study of GEM-foil defects with optical scanning system

Author

Kalliokoski, M. ; Hildén, T. ; Garcia, F. ; Lauhakangas, R. ; Numminen, A.

Author_Institution

Helsinki Inst. of Phys., Univ. of Helsinki, Helsinki, Finland

fYear

2010

fDate

Oct. 30 2010-Nov. 6 2010

Firstpage

1446

Lastpage

1449

Abstract

Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm × 100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from ⁵⁵Fe source. In this paper we present the results of these measurements.

Keywords

X-ray effects; ionisation chambers; photomultipliers; position sensitive particle detectors; readout electronics; ⁵⁵Fe source; GEM-detector construction; GEM-foil defects; X-rays irradiation; XY-readout; optical scanning system; quality control system; Area measurement; Atmospheric measurements; Copper; Current measurement; Detectors; Leakage current; Radiation effects;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE

Conference_Location

Knoxville, TN

ISSN

1095-7863

Print_ISBN

978-1-4244-9106-3

Type

conf

DOI

10.1109/NSSMIC.2010.5874011

Filename

5874011