Title :
Modified surface state of Cr(001) thin film surfaces observed by scanning tunneling spectroscopy
Author :
Sueoka, K. ; Oka, H.
Author_Institution :
Graduate Sch. of Inf. Sci. & Tech., Hokkaido Univ., Sapporo, Japan
Abstract :
The electronic properties of Cr(001) thin film surfaces with a reconstructed surface and the effect of the modification of the surface structure on the surface state are studied by scanning electron microscopy. STM/STS measurements are performed at room temperature with an electrochemically etched W tip. It is observed that the intensity of the peak (corresponding to a surface state) decreases as the tip sample distance increases. The surface state obtained on the c(2×2) Cr(001) thin film surfaces is found to shift upward as compared to the (1×1) Cr(001) surfaces.
Keywords :
chromium; metallic thin films; scanning electron microscopy; scanning tunnelling microscopy; scanning tunnelling spectroscopy; surface reconstruction; surface states; (1×1) surfaces; 20 degC; Cr; STM measurements; STS measurements; W; c(2×2) surfaces; electrochemically etched tip; reconstructed surface; room temperature; scanning tunneling spectroscopy; surface state; surface structure; thin film surfaces; Etching; Performance evaluation; Scanning electron microscopy; Sociotechnical systems; Spectroscopy; Surface reconstruction; Surface structures; Temperature; Transistors; Tunneling;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1463620
