A DOT1 & DOT4 MOSIS-compatible library

Author

Rucinski, Andrzej ; Stetson, Barrett ; Brundavani, S.T.P.

Author_Institution

Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA

fYear

2003

fDate

1-2 June 2003

Firstpage

83

Lastpage

84

Abstract

There exists a lack of balance between design and testing topics in microelectronic curricula. However, boundary scan as a virtual probe presents an opportunity to teach testing and design for testability in such a curriculum. This effort is facilitated by the use of IEEE standards, universal acceptance in industry, and the availability of low cost test equipment. This paper introduces a library of boundary scan components based on the IEEE standards. The library is being verified using the AMI 0.5 micron 40 pin Tiny Chip VLSI device fabricated through MOSIS services.

Keywords

IEEE standards; VLSI; academic libraries; boundary scan testing; design for testability; educational courses; integrated circuits; test equipment; DOT1 MOSIS; DOT4 MOSIS; IEEE standards; VLSI course; boundary scan components library; compatible library; design for testability; industry; institute of electrical and electronics engineers; low cost test equipment; metal oxide semiconductor implementation service; microelectronic curriculum; tiny chip VLSI device fabrication; very lagre scale integration; virtual probe; Application specific integrated circuits; Clocks; Graphics; Libraries; Microelectronics; Probes; Signal design; Switches; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Systems Education, 2003. Proceedings. 2003 IEEE International Conference on

Print_ISBN

0-7695-1973-3

Type

conf

DOI

10.1109/MSE.2003.1205265

Filename

1205265