DocumentCode :
3529867
Title :
Elastic cross-sections for low energy collision of Ar+ with Ne and Monte Carlo simulation of the transport of Ar+ ions in gaseous Ar/Ne mixtures
Author :
Barata, J.A.S. ; Conde, C.A.N.
Author_Institution :
Dept. de Fis., Univ. da Beira Interior, Covilha, Portugal
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
1476
Lastpage :
1479
Abstract :
The drift velocities and the longitudinal and transverse diffusion coefficients for Ar+ ions in gaseous Ar/Ne mixtures, at atmospheric pressures, for Ar concentrations between 1 and 20%, and reduced electric field strengths, E/N, from 1 to 100 Td, corresponding to E/p, from about 0.329 to 32.9 V cm-1 Torr-1 at 293 K, are calculated by Monte Carlo simulation. The Monte Carlo simulations use a set of integral and differential elastic collision cross-sections for Ar+ ions with neutral Ar and Ne atoms. Differential and integral elastic collision cross-sections for Ar+ ions with neutral Ne atoms are calculated, and reported for center-of-mass energies between 1 meV and 10 eV, using a modified Tang and Toennies ion-atom interaction potential model to describe ab initio spectroscopic data for the ArNe+ molecular ion and the long-range interaction potentials. The phase shifts were calculated with the JWKB approximation. The cross-sections for the collision of Ar+ ions with Ar atoms used were the ones calculated before by the authors.
Keywords :
Monte Carlo methods; ab initio calculations; argon; atom-ion collisions; neon; positive ions; proportional counters; Ar+; JWKB approximation; Monte Carlo simulation; Ne; ab initio spectroscopic data; differential elastic collision cross-sections; drift velocity; elastic cross-section; electric field strength; integral elastic collision cross-sections; ion transport; ion-atom interaction potential model; temperature 293 K; Argon; Couplings; Electric fields; Electron mobility; Ions; Monte Carlo methods; Stationary state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5874019
Filename :
5874019
Link To Document :
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