• DocumentCode
    352988
  • Title

    RF W-band wafer-to-wafer transition

  • Author

    Herrick, K.J. ; Katehi, L.P.B.

  • Author_Institution
    Radiat. Lab., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    11-16 June 2000
  • Firstpage
    73
  • Abstract
    Multiwafer silicon designs must provide an avenue for electrical signals to flow from wafer to wafer. For this purpose, a two-layer electrical bond is proposed to provide electrical connection between two coplanar waveguides on vertically stacked silicon wafers. Loss of approximately 0.1 dB is measured for this compact, packaged transition at W-band.
  • Keywords
    MIMIC; coplanar waveguides; integrated circuit interconnections; integrated circuit packaging; wafer bonding; 0.1 dB; W-band; coplanar waveguides; electrical connection; electrical signals; multiwafer designs; packaged transition; two-layer electrical bond; vertically stacked wafers; wafer-to-wafer transition; Circuits; Conductivity; Fabrication; Gold; Impedance; Insertion loss; Radio frequency; Silicon; Temperature; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest. 2000 IEEE MTT-S International
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-5687-X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2000.860888
  • Filename
    860888