DocumentCode :
3530055
Title :
Conductive micro-bead array detection by high-frequency eddy-current testing technique with SV-GMR sensor
Author :
Yamada, S. ; Chomsuwan, K. ; Hagino, T. ; Tian, H. ; Iwahara, M.
Author_Institution :
Inst. of Nature & Environ. Technol., Kanazawa Univ., Japan
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
419
Lastpage :
420
Abstract :
Applying of eddy-current testing (ECT) probe with spin-valve giant magnetoresistive (SV-GMR) sensor to high frequency excitation provides the feasibility of micro-defect detection for example high-density printed circuit board inspection. In this paper, the detection of conductive micro-bead with 250 to 760 μm diameter, and its feasibility are discussed. The analytical model is discussed and compared with experimental results to verify that the proposed technique is able to detect conductive micro-bead.
Keywords :
eddy current testing; giant magnetoresistance; magnetic sensors; spin valves; 250 to 760 mum; SV-GMR sensor; conductive microbead array detection; high frequency excitation; high-frequency eddy-current testing technique; microdefect detection; spin-valve giant magnetoresistive sensor; Analytical models; Circuit testing; Electrical capacitance tomography; Frequency; Giant magnetoresistance; Inspection; Magnetic sensors; Printed circuits; Probes; Sensor arrays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463638
Filename :
1463638
Link To Document :
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