• DocumentCode
    3530124
  • Title

    Reliable automotive pre-crash system with out-of-sequence measurement processing

  • Author

    Muntzinger, Marc M. ; Aeberhard, Michael ; Zuther, Sebastian ; Mählisch, Mirko ; Schmid, Matthias ; Dickmann, Juürgen ; Dietmayer, Klaus

  • Author_Institution
    Dept. for Environ. Perception, Res. & Adv. Eng., Daimler AG, Ulm, Germany
  • fYear
    2010
  • fDate
    21-24 June 2010
  • Firstpage
    1022
  • Lastpage
    1027
  • Abstract
    In an automotive pre-crash application, it is vital to quickly and accurately estimate the position and velocity of objects in the frontal area of the vehicle. To improve such estimations, several radar sensors are fused to detect objects. Due to their different performance characteristics, their measurements can arrive at the pre-crash processing unit out-of-sequence. This work presents several techniques to integrate measurements into a tracking algorithm that arrive with such an out-of-sequence measurement (OOSM) scenario. A comprehensive complexity analysis of the algorithms is also presented. Most importantly, the algorithms are run on a test vehicle during real crash scenarios. The algorithms´ performance is evaluated against reference data from a highly accurate laser scanner. It is shown that using advanced OOSM algorithms in pre-crash systems significantly increases performance and reduces computational cost compared to previous approaches.
  • Keywords
    automotive engineering; object detection; radar imaging; road vehicle radar; sensors; vehicle dynamics; automotive pre-crash system; complexity analysis; object detection; out-of-sequence measurement processing; position estimation; radar sensors; velocity estimation; Algorithm design and analysis; Automotive engineering; Delay; Laser radar; Object detection; Radar tracking; Sensor fusion; Sensor systems; Signal processing algorithms; Vehicle crash testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Vehicles Symposium (IV), 2010 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1931-0587
  • Print_ISBN
    978-1-4244-7866-8
  • Type

    conf

  • DOI
    10.1109/IVS.2010.5548149
  • Filename
    5548149