Title :
[Copyright notice]
Abstract :
The following topics are dealt with: on-chip RF; on-chip physics/modeling; on-chip latch-up; testing; system level ESD; on-chip CMOS; and MR heads.
Keywords :
CMOS integrated circuits; electrostatic discharge; integrated circuit modelling; MR heads; on-chip CMOS; on-chip RF; on-chip latch-up; on-chip modeling; on-chip physics; system level ESD; testing;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
