• DocumentCode
    3530197
  • Title

    Power density aware power gate placement optimization scheme

  • Author

    Yong, Lee Kee ; Ung, Chee Kong

  • Author_Institution
    Intel Microelectron., Bayan Lepas, Malaysia
  • fYear
    2010
  • fDate
    3-4 Aug. 2010
  • Firstpage
    38
  • Lastpage
    42
  • Abstract
    As we are marching towards deeper sub-micron technology from process scaling, the transistor leakage itself had became more and more dominant to the total component power, which is unavoidable. Clever employment of power gating / sleep transistor / MTCMOS technology can help to shut off leakage power from un-use blocks. However over placement of power gate cells to reduce ON stage IR voltage drop can yield higher leakage power during OFF stage at high temperature and fast skew. This paper described the circuit analysis, optimization strategies and design methodology to tackle this issue head on. A proposal on power gate placement optimization using the concept of power windowing and Power Perimeter Scan (PPS) was introduced in this paper. Details break down of circuit modeling and design trade off on Power Gating FETs was described including simulation results and equations to aid the illustrations. The overall power saving using MTCMOS was re-evaluated for total leakage minimization.
  • Keywords
    CMOS integrated circuits; circuit optimisation; integrated circuit design; leakage currents; low-power electronics; network analysis; system-on-chip; MTCMOS technology; circuit analysis; power density aware power gate placement optimization scheme; power gating; power perimeter scan; power windowing; sleep transistor; Circuit analysis; Circuit simulation; Design methodology; Design optimization; Employment; Equations; FETs; Proposals; Temperature; Voltage; IR Drop; MTCMOS; Optimization; Power Gating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4244-7809-5
  • Type

    conf

  • DOI
    10.1109/ASQED.2010.5548158
  • Filename
    5548158