DocumentCode
3530199
Title
Scintillation properties and self absorption in SrI2 :Eu2+
Author
Alekhin, Mikhail S. ; De Haas, Johan T M ; Krämer, Karl W. ; Khodyuk, Ivan V. ; De Vries, Lorette ; Dorenbos, Pieter
Author_Institution
Fac. of Appl. Sci., Delft Univ. of Technol., Delft, Netherlands
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
1589
Lastpage
1599
Abstract
The scintillation properties of pure SrI2 and SrI2 doped with 0.5%, 0.86%, 2%, and 5% europium were studied. Different techniques were used to measure γ-ray excited pulse-height and scintillation decay time spectra, and to perform X-ray excited and optically excited emission spectroscopy. Eu2+ emission and self-trapped exciton (STE) emission was observed in SrI2:Eu2+ samples. These emissions were studied as a function of temperature, Eu concentration, and sample size. A spectral overlap was observed between Eu2+ excitation and emission spectra, which strongly depends on temperature. The light yield, energy resolution and luminescence decay profiles reveal also a strong dependence on temperature, sample size, and Eu concentration. The observations were analyzed and interpreted in terms of two separate models. One model consists of the relation between STE and Eu2+ emissions and the other deals with self absorption processes.
Keywords
X-ray spectroscopy; doping; luminescence; solid scintillation detectors; strontium compounds; Eu concentration; Eu2+ emission; Eu2+ excitation; SrI2:Eu2+; X-ray excited emission spectroscopy; energy resolution; gamma-ray excited pulse-height; light yield; luminescence decay profiles; optically excited emission spectroscopy; sample size; scintillation decay time spectra; scintillation properties; self absorption processes; self-trapped exciton emission; spectral overlap; Absorption; Crystals; Energy resolution; Photonics; Temperature dependence; Temperature distribution; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874044
Filename
5874044
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