DocumentCode :
3530199
Title :
Scintillation properties and self absorption in SrI2:Eu2+
Author :
Alekhin, Mikhail S. ; De Haas, Johan T M ; Krämer, Karl W. ; Khodyuk, Ivan V. ; De Vries, Lorette ; Dorenbos, Pieter
Author_Institution :
Fac. of Appl. Sci., Delft Univ. of Technol., Delft, Netherlands
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
1589
Lastpage :
1599
Abstract :
The scintillation properties of pure SrI2 and SrI2 doped with 0.5%, 0.86%, 2%, and 5% europium were studied. Different techniques were used to measure γ-ray excited pulse-height and scintillation decay time spectra, and to perform X-ray excited and optically excited emission spectroscopy. Eu2+ emission and self-trapped exciton (STE) emission was observed in SrI2:Eu2+ samples. These emissions were studied as a function of temperature, Eu concentration, and sample size. A spectral overlap was observed between Eu2+ excitation and emission spectra, which strongly depends on temperature. The light yield, energy resolution and luminescence decay profiles reveal also a strong dependence on temperature, sample size, and Eu concentration. The observations were analyzed and interpreted in terms of two separate models. One model consists of the relation between STE and Eu2+ emissions and the other deals with self absorption processes.
Keywords :
X-ray spectroscopy; doping; luminescence; solid scintillation detectors; strontium compounds; Eu concentration; Eu2+ emission; Eu2+ excitation; SrI2:Eu2+; X-ray excited emission spectroscopy; energy resolution; gamma-ray excited pulse-height; light yield; luminescence decay profiles; optically excited emission spectroscopy; sample size; scintillation decay time spectra; scintillation properties; self absorption processes; self-trapped exciton emission; spectral overlap; Absorption; Crystals; Energy resolution; Photonics; Temperature dependence; Temperature distribution; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5874044
Filename :
5874044
Link To Document :
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