• DocumentCode
    3530274
  • Title

    Gate driver circuit design optimization for TFT-LCD panel manufacturing

  • Author

    Lee, Kuo-Fu ; Li, Yiming ; Lo, I-Hsiu ; Chiang, Tony ; Huang, Kuen-Yu ; Hsieh, Tsau-Hua

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    3-4 Aug. 2010
  • Firstpage
    13
  • Lastpage
    16
  • Abstract
    For TFT-LCD panel manufacturing, gate driver circuit with amorphous silicon thin-film transistor (TFT-ASG circuit) plays an important role. In this paper, we propose two different ASG driver circuit topologies to improve crucial dynamic characteristics and then optimize them with circuit sizing by simulation-based evolutionary method which integrates genetic algorithm and circuit simulator on the unified optimization framework [1]. The first circuit consisting of fourteen a-Si:H TFT devices is designed for the specifications of the rise time <; 1.5 μs, the fall time <; 1.5 μs and the ripple voltage <; 3 V with the minimization of total layout area. The second one with eight a-Si:H TFTs and two capacitors is optimized with the additional constraint that power dissipation <; 2 mW. The optimized results of this study successfully meet the desired specifications and sensitivity analysis of these results shows promising characteristics which could be used for optimal manufacturing of TFT-LCD panel.
  • Keywords
    genetic algorithms; liquid crystal displays; network synthesis; sensitivity analysis; thin film transistors; TFT-LCD panel manufacturing; amorphous silicon thin-film transistor; capacitor; circuit simulator; circuit sizing; gate driver circuit design optimization; genetic algorithm; sensitivity analysis; simulation-based evolutionary method; unified optimization framework; Amorphous silicon; Circuit simulation; Circuit topology; Design optimization; Driver circuits; Genetic algorithms; Manufacturing; Optimization methods; Thin film transistors; Voltage; Gate Driver Circuits; Genetic Algorithm; Simulation-Based Optimization; Thin-Film Transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4244-7809-5
  • Type

    conf

  • DOI
    10.1109/ASQED.2010.5548165
  • Filename
    5548165