DocumentCode :
3530346
Title :
A random access addressing of field emission lamp for local dimming lighting applications
Author :
Jeong, Jin-Woo ; Kim, Dong-Il ; Kang, Jun-Tae ; Kim, Jae-Woo ; Song, Yoon-Ho
Author_Institution :
Convergence Components & Mater. Res. Lab., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
51
Lastpage :
52
Abstract :
In recent, field emission lamp (FEL) with carbon nanotube (CNT) field emitters was intensively studied for a high performance back light unit (BLU) in LCD. The CNT-FEL can give a local dimming BLU increasing contrast ratio, reducing motion blur and saving power consumption. The local FE blocks, in general, are arranged in a matrix format and addressed by voltage pulse signals. In this method the row bus selects a row line of local blocks consecutively and the column bus delivers a dimming signal to each block in the selected row line and vice versa as in a conventional matrix addressing, which is common and easy in CNT-FELs [1-3]. However, it has disadvantages of a high addressing voltage depending on the operation voltage of CNT emitters and a shortened duty as the increase in the number of local blocks. If the image is refreshed by a frequency of f and the number of row lines of local blocks is N then the duty time to each row line is given by 1/fN, which limits the whole luminance and the number of local blocks for a given panel size. Another demerit of conventional voltage driving is that it hardly makes up for the degradation of CNT emitters and so the lifetime of CNT-FEL may be solved by only the improvement in intrinsic property of CNT emitters.
Keywords :
carbon nanotubes; field emission displays; field emitter arrays; lighting; back light unit; carbon nanotube field emitters; field emission lamp; local dimming lighting applications; random access addressing; Anodes; Cathodes; Contacts; Degradation; Dielectrics and electrical insulation; Electrodes; Lamps; Materials science and technology; Organic materials; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International
Conference_Location :
Shizuoka
Print_ISBN :
978-1-4244-3587-6
Electronic_ISBN :
978-1-4244-3588-3
Type :
conf
DOI :
10.1109/IVNC.2009.5271845
Filename :
5271845
Link To Document :
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