DocumentCode
3530407
Title
Burst Mode Memories Improve Cache Design
Author
Amitai, Zwie ; Wyland, David C.
Author_Institution
Quality Semiconductor, Inc.
fYear
1991
fDate
16-18 April 1991
Firstpage
279
Lastpage
282
Abstract
Burst mode memories improve cache design by improving refill time on cache misses. Burst mode RAMs allow refill of a four word cache line in five clock cycles at 50 mHz rather than the eight clock cycles that would be required for a conventional SRAM. Burst mode RAMs also have clock synchronous interfaces which make them easier to design into systems, particularly at clock rates of 25 mHz and above.
Keywords
Cache memory; Clocks; Counting circuits; Delay effects; Engineering management; Planing; Quality management; Random access memory; Read-write memory; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro International, 1991
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ELECTR.1991.718653
Filename
718653
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