• DocumentCode
    3530468
  • Title

    Inelastic electron tunneling spectroscopy in magnetic tunnel junctions with MgO(001) tunnel barrier

  • Author

    Miyakoshi, T. ; Ando, Y. ; Oogane, M. ; Miyazaki, Toshimasa ; Kubota, H. ; Fukushima, A. ; Nagahama, T. ; Yuasa, S.

  • Author_Institution
    Tohoku Univ., Sendai, Japan
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    473
  • Lastpage
    474
  • Abstract
    Fully, epitaxially-grown Fe(001)/MgO(001)/Fe(001) magnetic tunnel junctions were prepared by using electron beam evaporation under ultrahigh vacuum. The dynamic resistance curve and the inelastic electron tunnelling (IET) spectrum were measured simultaneously at 4.2 K by a lock-in technique using a homemade electrical circuit. Both curves show asymmetry with the bias. Peaks observed in the IET spectra for antiparallel (AP) magnetization around ±25 mV are considered to be due to magnon-assisted inelastic excitation. The strong intensity of the IET spectra in AP magnetization causes the decrease of tunneling magnetoresistance (TMR) ratio around the voltage of the peak position. The existence of spin-flip scattering sites at the interface between the bottom electrode and the MgO barrier can be attributed to the obvious shoulder observed around 150 mV for negative bias. These results imply that the strong asymmetry of the bias dependence of TMR could be improved by reducing the dislocations.
  • Keywords
    dislocations; electric resistance; electron beam deposition; iron; magnesium compounds; magnetic epitaxial layers; magnetic multilayers; magnetisation; magnons; tunnelling magnetoresistance; tunnelling spectra; vacuum deposited coatings; vapour phase epitaxial growth; 4.2 K; Fe-MgO-Fe; antiparallel magnetization; dislocations; dynamic resistance; electrical circuit; electrode; electron beam evaporation; epitaxial growth; inelastic electron tunneling spectroscopy; lock-in technique; magnetic tunnel junctions; magnon-assisted inelastic excitation; spin-flip scattering sites; tunnel barrier; tunneling magnetoresistance; ultrahigh vacuum; Circuits; Electric resistance; Electric variables measurement; Electrical resistance measurement; Electron beams; Magnetic tunneling; Magnetization; Spectroscopy; Tunneling magnetoresistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1463665
  • Filename
    1463665