Title :
The digital silicon photomultiplier — System architecture and performance evaluation
Author :
Frach, Thomas ; Prescher, Gordian ; Degenhardt, Carsten ; Zwaans, Ben
Author_Institution :
Philips Digital Photon Counting, Aachen, Germany
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
In this paper we present the first fully digital implementation of the Silicon Photomultiplier. The chip design is based on the technology demonstrator chip presented in. The new sensor represents a self-contained detector including a JTAG controller for configuration and test, single-ended and differential clock and test input signals, an integrated acquisition controller and two serial data outputs. The sensor is based on a single photon avalanche photodiode (SPAD) technology integrated in a standard CMOS process flow. Photons are detected directly by sensing the voltage at the SPAD terminal using a dedicated cell electronics block next to each diode. This block also contains active quenching and recharge circuits as well as a one bit memory for the selective activation of individual detector cells. A balanced trigger network is used to propagate the trigger signal from all cells to the two integrated time-to-digital converters. Photons are detected and counted as digital signals, thus making the sensor less susceptible to temperature variations and electronic noise. The resulting data packets are transferred to the readout system through a serial data interface. In this paper, we discuss the new sensor architecture and evaluate its performance.
Keywords :
avalanche photodiodes; nuclear electronics; photomultipliers; photon counting; silicon radiation detectors; solid scintillation detectors; JTAG controller; SPAD technology; active quenching; balanced trigger network; chip design; dedicated cell electronics block; digital silicon photomultiplier; electronic noise; fully digital implementation; integrated acquisition controller; integrated time-to-digital converters; performance evaluation; photon counting; photon detection; recharge circuits; self-contained detector; sensor; serial data interface; single photon avalanche photodiode; standard CMOS process flow; system architecture; technology demonstrator chip; temperature variations; Crystals; Laser beams; Measurement by laser beam; Photomultipliers; Photonics; Pixel; Silicon;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874069