DocumentCode :
3530690
Title :
First high-frequency and power demonstration of InGaAlAs/GaAsSb/InP double HBTs
Author :
Xin Zhu ; Pavlidis, Dimitris ; Guangyuan Zhao
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear :
2003
fDate :
12-16 May 2003
Firstpage :
149
Lastpage :
152
Abstract :
InGaAlAs/GaAsSb/InP Double HBTs with micrometer emitter size were designed, processed and characterized with DC, microwave and power performance for the first time. In addition to the advantages of using type-II band line-up at base-collector junction, the DHBT structure results in small turn-on voltage and ballistic launching of electrons due to the positive conduction band discontinuity from the emitter to base. Fabricated large DHBTs showed high DC gain (>80), small turn-on voltage of 0.62V, almost zero offset voltage, and nearly ideal base and collector current characteristics. Small DHBTs demonstrated VCEO >8V and stable operation at high current density exceeding 100kA/cm2. Maximum fT of 57GHz and maximum fmax of 66GHz were achieved from 1×20μm2 device at JC = 8.0×104 A/cm2 and VCE =3.5V. Preliminary power measurement of 2×15μm2 device showed a linear gain of 10dB and compressed output power of 5dBm at 5GHz.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; semiconductor device measurement; 0.62 V; 3.5 V; 5 GHz; 8 V; DC gain; DHBT structure; InGaAlAs-GaAsSb-InP; InGaAlAs/GaAsSb/InP double HBTs; high-frequency; turn-on voltage; type-II band line-up; Design engineering; Doping; Electron emission; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Power engineering and energy; Thermal conductivity; Voltage; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN :
0-7803-7704-4
Type :
conf
DOI :
10.1109/ICIPRM.2003.1205335
Filename :
1205335
Link To Document :
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