DocumentCode :
3530961
Title :
First results of spherical GEMS
Author :
Pinto, Serge Duarte ; Alfonsi, Matteo ; Brock, Ian ; Croci, Gabriele ; David, Eric ; De Oliveira, Rui ; Ropelewski, Leszek ; Van Stenis, Miranda ; Taureg, Hans ; Villa, Marco
Author_Institution :
CERN, Geneva, Switzerland
fYear :
2010
fDate :
Oct. 30 2010-Nov. 6 2010
Firstpage :
1877
Lastpage :
1880
Abstract :
We developed a method to make GEM foils with a spherical geometry. Tests of this procedure and with the resulting spherical GEMS are presented. Together with a spherical drift electrode, a spherical conversion gap can be formed. This eliminates the parallax error for detection of X-rays, neutrons or UV photons when a gaseous converter is used. This parallax error limits the spatial resolution at wide scattering angles. Besides spherical GEMS, we have developed curved spacersto maintain accurate spacing, and a conical field cage to prevent edge distortion of the radial drift field up to the limit of the angular acceptance of the detector. With these components first tests are done in a setup with a spherical entrance window but a planar readout structure; results will be presented and discussed. A flat readout structure poses difficulties, however. Therefore we will show advanced plans to make a prototype of an entirely spherical double-GEM detector, including a spherical 2D readout structure. This detector will have a superior position resolution, also at wide angles, and a high rate capability.
Keywords :
X-ray detection; ionisation chambers; neutron detection; photomultipliers; position sensitive particle detectors; readout electronics; 2D readout structure; GEMS foil; UV photon detection; X-ray detection; conical field cage; curved spacers; neutron detection; parallax error; spherical conversion gap; spherical drift electrode; superior position resolution; Assembly; Copper; Detectors; Electrodes; Gas detectors; Neutrons; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
ISSN :
1095-7863
Print_ISBN :
978-1-4244-9106-3
Type :
conf
DOI :
10.1109/NSSMIC.2010.5874100
Filename :
5874100
Link To Document :
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