DocumentCode :
3530965
Title :
Mixed AC/DC-coupled averaging technique for ADC nonlinearity reduction
Author :
Fan, Siqiang ; Zhao, H. ; Tang, H. ; Wang, X. ; Lin, L. ; Liu, J. ; Fang, Q. ; Wang, Albert ; Zhao, B.
Author_Institution :
Freescale Semicond. Inc., Irvine, CA, USA
fYear :
2010
fDate :
3-4 Aug. 2010
Firstpage :
102
Lastpage :
105
Abstract :
A new combined AC/DC-coupled output averaging technique for input amplifier design of flash analog-to-digital converters (ADC) is presented. The new offset averaging design technique takes full advantages of traditional DC-coupled resistance averaging and AC-coupled capacitance averaging techniques to minimize offset-induced ADC nonlinearities. Circuit analysis allows selection of optimum resistance and capacitance averaging factors to achieve maximum offset reduction in ADC designs. The new averaging method was verified in designing a 4bits 1Gs/s flash ADC that was implemented in foundry 0.13μm CMOS technology.
Keywords :
AC-DC power convertors; CMOS analogue integrated circuits; amplifiers; capacitance; electric resistance; AC-coupled capacitance averaging; ADC design; ADC nonlinearity reduction; CMOS technology; DC-coupled resistance averaging; amplifier design; circuit analysis; flash analog-to-digital converter; maximum offset reduction; mixed AC/DC-coupled output averaging technique; offset averaging design; optimum resistance; size 0.13 mum; CMOS integrated circuits; CMOS technology; Capacitance; Capacitors; Circuit analysis; High speed integrated circuits; Optical amplifiers; Resistors; Sampling methods; Signal design; analog-to-digital converter; capacitor averaging; flash ADC; offset averaging; resistor averaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4244-7809-5
Type :
conf
DOI :
10.1109/ASQED.2010.5548222
Filename :
5548222
Link To Document :
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