• DocumentCode
    3531061
  • Title

    Design and measurement of Band V WCDMA LNA utilizing design kit with scalable parametric cell inductors

  • Author

    Salleh, Syahrizal ; Hashim, Mohamad Faizal

  • Author_Institution
    Telekom R&D, Cyberjaya, Malaysia
  • fYear
    2010
  • fDate
    3-4 Aug. 2010
  • Firstpage
    118
  • Lastpage
    125
  • Abstract
    A low-noise amplifier (LNA) integrated circuit (IC) has been designed and implemented on a 0.13μm RF CMOS process technology. The performance of the LNA has been targeted to exceed WCDMA standard specification. This paper presents the design methodology and compares the simulated and measurement results of the cascode LNA with inductive degeneration. There were expected mismatch between simulation and measurement data, thus some of the matching elements were intentionally placed outside of the chip. Additionally, target frequency on simulation was designed at a general 850MHz frequency but later on measurement the target frequency was moved close to the center of receive frequency of Band V of WCDMA. On the simulation, at resonance frequency of 850MHz the NF is 0.54dB, 1dB input compression point is -26.67dBm and S21 is 27.86dB. On measurement where impedance matching were done exactly as in simulation with the exception in value of quality factor Q of the external passive devices, the NF about 2dB, 1dB input compression point is -25.3dB and S21 is 18dB at 875MHz. Value of LS and LG were adjusted to move peak of S21 to be at almost the new target frequency of 881.5MHz. Measurement result after impedance was matched to the band V receive center frequency, S21 has dropped to 13.37dB, NF has jumped to 2.65dB but linearity improved where 1dB input compression point has increased to -18.14dBm mainly because the drop in S21.
  • Keywords
    CMOS integrated circuits; UHF amplifiers; code division multiple access; low noise amplifiers; RF CMOS process technology; band V WCDMA LNA; frequency 850 MHz; impedance matching; low noise amplifier; scalable parametric cell inductors; CMOS integrated circuits; Frequency measurement; Impedance measurement; Inductors; Integrated circuit measurements; Low-noise amplifiers; Multiaccess communication; Noise measurement; Radiofrequency integrated circuits; Semiconductor device measurement; RF CMOS integrated circuit; cascode with inductive degeneration; chip-on board; external matching; low noise amplifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4244-7809-5
  • Type

    conf

  • DOI
    10.1109/ASQED.2010.5548229
  • Filename
    5548229