Title :
Performance of fast high-resolution Muon drift tube chambers for LHC upgrades
Author :
Bittner, B. ; Dubbert, J. ; Kilgenstein, M. ; Kortner, O. ; Kortner, S. ; Kroha, H. ; Legger, F. ; von Loeben, J. ; Richter, R. ; Schwegler, P. ; Adomeit, S. ; Biebel, O. ; Engl, A. ; Hertenberger, R. ; Rauscher, F. ; Zibell, A.
Author_Institution :
Max-Planck-Inst. fur Phys., München, Germany
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
Monitored drift tube chambers are used as precision tracking detectors in the muon spectrometer of the ATLAS experiment at the LHC at CERN. These chambers provide a spatial resolution of 35 mm and a tracking efficiency of close to 100 % up to background rates of 0.5 kHz/cm2, the former being limited at higher rates mainly due to space charge effects and the latter due to the maximum drift time of 700 ns. For LHC upgrades, a faster drift tube chamber has been developed, using drift tubes with a diameter of 15mm instead of 30 mm. The increased channel density and shorter drift time of about 200 ns raise the rate capability to about 10 kHz/cm2, while retaining the spatial resolution. A prototype chamber with trapezoidal shape consisting of 2×8 layers of 15mm diameter drift tubes with an active surface of 0.8 m2 has been constructed. This chamber has been tested at CERN with a 180 GeV muon beam (H8) and with cosmic ray muons at the Gamma Irradiation Facility (GIF) at high γ radiation rates.
Keywords :
cosmic ray muons; drift chambers; gamma-ray effects; particle spectrometers; position sensitive particle detectors; ATLAS experiment; Gamma Irradiation Facility; LHC upgrades; channel density; cosmic ray muons; fast high-resolution muon drift tube chambers; gamma-radiation rates; maximum drift time; muon beam; muon spectrometer; precision tracking detectors; space charge effects; Detectors; Electron tubes; Large Hadron Collider; Mesons; Prototypes; Spatial resolution; Wires; LHC high luminosity; LHC upgrade; drift tube; muon chamber;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874110