DocumentCode :
3531268
Title :
Atomic hydrogen-assisted selective MBE growth of hexagonal InGaAs ridge quantum wire networks having a high density of giga-nodes/cm2
Author :
Fukushi, Tetsuo ; Muranaka, Tsutomu ; Hasegawa, Hideki
Author_Institution :
Res. Center for Integrated Quantum Electron., Hokkaido Univ., Sapporo, Japan
fYear :
2003
fDate :
12-16 May 2003
Firstpage :
315
Lastpage :
318
Abstract :
Successful growth of high-density hexagonal InGaAs ridge quantum wire (QWR) networks by an atomic hydrogen (H*)-assisted selective MBE technique is reported. As the templates, periodic hexagonal patterns with a pitch of 300 nm, consisting of <1~10>- and <510>-oriented mesa stripes, were prepared on [001] InP substrates by electron beam lithography and wet chemical etching. Then, InGaAs and InAlAs ridge structures were grown under H* irradiation, and they were characterized by SEM and AFM measurements. Although H* irradiation significantly improved facet flatness in both cases, InAlAs ridges were found to be better for QWR growth. By supplying InAlAs/InGaAs/InAlAs materials on the InAlAs ridge structure, a hexagonal network, consisting of embedded InGaAs QWRs and having a node density of 1 ×109 cm-2 could be successfully realized. Intense and narrow PL peaks from the network indicated high spatial uniformity and high crystalline quality of QWRs.
Keywords :
III-V semiconductors; electron beam lithography; etching; gallium arsenide; indium compounds; ion beam effects; molecular beam epitaxial growth; photoluminescence; semiconductor growth; semiconductor quantum wires; 300 nm; AFM; H* irradiation; InGaAs; PL; QWR; SEM; atomic hydrogen-assisted selective MBE growth; electron beam lithography; hexagonal InGaAs ridge quantum wire networks; wet chemical etching; Chemicals; Crystallization; Electron beams; Hydrogen; Indium compounds; Indium gallium arsenide; Indium phosphide; Lithography; Wet etching; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN :
0-7803-7704-4
Type :
conf
DOI :
10.1109/ICIPRM.2003.1205378
Filename :
1205378
Link To Document :
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