• DocumentCode
    3531393
  • Title

    NERC/FERC requirements impact on testing philosophy and reliability — Good or bad?

  • Author

    Apostolov, A. ; Vandiver, B.

  • Author_Institution
    OMICRON Electron., Los Angeles, CA, USA
  • fYear
    2011
  • fDate
    11-14 April 2011
  • Firstpage
    334
  • Lastpage
    343
  • Abstract
    This paper reviews past and present NERC/FERC requirements for relay testing of grid connected protection systems in the US/Canada with a focus on the final draft of PRC-005-2. It will attempt to clarify core requirements that are changing past testing philosophies and address practical testing methods for legacy relays and newer multifunctional digital relays. During the past decade, protective relays have made tremendous advancements in technology; however, many technicians and relay engineers remain confused as to the philosophy, focus, and techniques needed to effectively test these devices without compromising the commissioned status. This paper further clarifies the differences in the philosophical and practical testing of electromechanical, static design, single phase vs. multiphase, microprocessor-based, and modern multifunctional digital relays. It will also discuss some appropriate techniques, and present methods to avoid in the testing process. It will discuss the pitfalls associated with changing relay settings during the testing process, what relay self-diagnostics really means, and provide suggestions to typical mistakes. A comparison between testing protective relay elements as opposed to associated logic functions and schemes is evaluated. Many test procedures provided by relay manufactures are written for manual or entry level functional testing and can lead to undesired operations and reliability issues.
  • Keywords
    electromechanical effects; fault diagnosis; maintenance engineering; microprocessor chips; power grids; power system protection; power system reliability; relay protection; substation automation; FERC requirements impact; NERC requirements impact; electromechanical testing; grid connected protection system; legacy relay testing method; logic function; microprocessor chips; multifunctional digital relay; protective relays; relay self-diagnostics; static design; Circuit breakers; Circuit faults; Maintenance engineering; Monitoring; Relays; Reliability; Testing; Distance protection; FERC; IEC 61850; NERC; maintenance; reliability; testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Protective Relay Engineers, 2011 64th Annual Conference for
  • Conference_Location
    College Station, TX
  • Print_ISBN
    978-1-4577-0494-9
  • Type

    conf

  • DOI
    10.1109/CPRE.2011.6035635
  • Filename
    6035635