DocumentCode :
3531571
Title :
A trial for fabricating a spin-filter operating at room temperature using a ferromagnetic insulator
Author :
Goto, R. ; Tezuka, N. ; Sugimoto, S. ; Inomata, K.
Author_Institution :
Graduate Sch. of Eng., Tohoku Univ., Japan
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
613
Lastpage :
614
Abstract :
In this study, we attempt to develop a spin-filtering device using a ferromagnetic barrier which works at room temperature. We use CoFe2O4 as a ferromagnetic insulator, which is considered as a fully-spin polarized ferromagnet. Due to its high Curie temperature, this device is expected to work at room temperature. Both CoFe2O4 thin films and tunnel junctions with a CoFe2O4 barrier were fabricated on thermally oxidized Si and MgO [110] single crystal substrates by RF-magnetron sputtering. The tunnel junctions consists of TiN/CoFe2O4/Al and TiN/CoFe2O4/Ni80Fe20. Crystal structure of the films were characterized by X-ray diffraction (XRD), magnetic properties were measured by vibrating sample magnetometers (VSM) and chemical states of the films were determined by X-ray photoelectron spectroscopy (XPS). The resistance (R)-field (H) curves are measured in spin-filtering devices with a new nm thick CoFe2O4 barrier by the DC four probe method.
Keywords :
Curie temperature; X-ray diffraction; X-ray photoelectron spectra; aluminium; cobalt compounds; coercive force; crystal structure; ferromagnetic materials; iron alloys; magnetic thin films; magnetic tunnelling; magnetometers; nickel alloys; soft magnetic materials; spin polarised transport; sputter deposition; titanium compounds; 293 K; Curie temperature; DC four probe method; MgO; RF magnetron sputtering; Si; TiN-CoFe2O4-Al; TiN-CoFe2O4-Ni80Fe20; XPS; XRD; chemical states; crystal structure; ferromagnetic insulator; fully spin polarized ferromagnet; magnetic properties; room temperature; spin-filtering devices; tunnel junctions; vibrating sample magnetometers; Electrical resistance measurement; Insulation; Iron; Magnetic films; Polarization; Semiconductor thin films; Sputtering; Temperature; Tin; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1463735
Filename :
1463735
Link To Document :
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