DocumentCode
3531582
Title
A High Speed DMA Transaction Method for PCI Express Devices
Author
Peng Yu ; Li Bo ; Liu Datong ; Peng Xiyuan
Author_Institution
Autom. Test & Control Inst., Harbin Inst. of Technol., Harbin
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
4
Abstract
PCI Express is being more and more widely deployed for its attractive bandwidth in virtual instrument design. However, very few PCI express transaction methods can be found in literature. So, this paper presents a novel PCI Express DMA transaction method based on bridge chip PEX 8311. Furthermore, we propose a new method to optimize PCI Express DMA Transaction through improving both bus-efficiency and DMA-efficiency. A novel FSM design to respond data and address cycles on PCI Express bus is introduced, and a continuous data burst is realized, which greatly promote bus-efficiency. As the foundation of the whole design, a successful 2.5G PCI Express interface design is presented. Then, to make a whole solution, in software design, WDM driver framework and three successful DMA optimizing options for PCI Express devices are presented to improve DMA-efficiency. At last, a FSM-based test to data transaction speed is proposed. Experiments show that method discussed here can reach a maximum DMA WRITE speed up to 166 MBytes/s and DMA READ speed up to 136 MBytes/s. Both of them exceed PCI theoretical maximum speed (133MBytes/s). In fact, this paper provides not noly a PCI Express example, but also PCI Express interface solution and DMA transaction method which can be directly extended into high speed PXI-Express applications and so forth. That is quite meaningful to next generation instrumentation.
Keywords
file organisation; peripheral interfaces; storage management chips; transaction processing; FSM design; PCI express devices; bridge chip PEX 8311; byte rate 133 MByte/s; byte rate 136 MByte/s; byte rate 166 MByte/s; direct memory access; high speed DMA transaction method; virtual instrument design; Automatic control; Automatic testing; Bandwidth; Bridges; Computer peripherals; Instruments; Optimization methods; Read-write memory; Software design; Wavelength division multiplexing;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960747
Filename
4960747
Link To Document